Artikel
Titel Autor Quelle

Hoffmann, MJ; Knudson, PE; Silver-Thorn, MB

IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, 2008, Band 55, Heft 12, S. 2786-2791

Fett, T; Rizzi, G; Bahr, HA; Bahr, U; Pham, VB; Balke, H

ENGINEERING FRACTURE MECHANICS, 2008, Band 75, Heft 8, S. 2246-2259

Bäurer, M; Zagonel, LF; Barrett, N; Hoffmann, MJ

INTERFACIAL NANOSTRUCTURES IN CERAMICS: A MULTISCALE APPROACH; JOURNAL OF PHYSICS CONFERENCE SERIES, 2008, Band 94, S. 12015-12015

Bäurer, M; Zagonel, LF; Barrett, N; Hoffmann, MJ

JOURNAL OF PHYSICS, 2008, Conference Series 94

Erdem, E; Eichel, R-A; Kungl, H; Hoffmann, M J; Ozarowski, A; van Tol, J; Brunel, LC

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 2008, Band 55, Heft 5, S. 1061-1068

Fouquet-Parry, V; Paumier, F; Guittet, MJ; Gautier-Soyer, M; Satet, R; Hoffmann, MJ; Becher, PF; Painter, GS

APPLIED SURFACE SCIENCE, 2008, Band 154, Heft 15, S. 4665-4670

Ceseracciu, L; Jimenez-Pique, E; Fett, T; Anglada, M

COMPOSITES SCIENCE AND TECHNOLOGY, 2008, Band 68, Heft 1, S. 209-214

Eichel, RA; Erhart, P; Träskelin, P; Albe, K; Kungl, H; Hoffmann, MJ

PHYSICAL REVIEW LETTERS, 2008, Band 100, Heft 9, S. 95504-95700

Fett, T; Riva, M; Hoffmann, MJ; Oberacker, R; Munz, D

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2008, Band 99, Heft 10, S.1107-1112

Fett, T; Riva, M; Hoffmann, MJ; Oberacker, R; Munz, D

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2008, Band 99, Heft 10, S. 1107-1112

Esfehanian, M; Oberacker, R; Fett, T; Hoffmann, MJ

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2008, Band 91, Heft 11, S. 3803-3805

Fett, T; Fünfschilling, S; Hoffmann, MJ; Oberacker, R

INTERNATIONAL JOURNAL OF FRACTURE, 2008, Band 153, Heft 2 S. 153-159

Hall, DA; Mori, T; Withers, PJ; Kungl, H; Hoffmann, MJ; Wright, J

MATERIALS SCIENCE AND TECHNOLOGY, 2008, Band 24, Heft 8, S. 927-933

Hall, DA; Mori, T; Withers, PJ; Kungl, H; Hoffmann, MJ; Wright, J

MATERIALS SCIENCE AND TECHNOLOGY, 2008, Band 24, Heft 8, S. 927-933

Anteboth, S; Bruckner-Foit, A; Hoffmann, MJ; Sutter, U; Schimmel, T; Muller M

COMPUTATIONAL MATERIALS SCIENCE, 2008, Band 41, Heft 3, S. 420-429

Farooq, MU; Villaurrutia, R; MacLaren, I; Burnett, TL; Comyn, TP; Bell, AJ; Kungl, H; Hoffmann MJ

JOURNAL OF APPLIED PHYSICS, 2008, Band 104, Heft 2, Artikel Nr. 024111

Fett, T; Rizzi, G; Creek, D; Wagner, S; Guin, JP; Lopez-Cepero, J; Wiederhorn, SM

PHYSICAL REVIEW B, 2008, Band 77

Fett, T; Rizzi, G; Creek, D; Wagner, S; Guin, JP; Lopez-Cepero, JM; Wiederhorn, SM

PHYSICAL REVIEW B, 2008, Band 77, Heft 17, Artikel Nr. 174110

Fett, T; Creek, D; Wagner, S; Rizzi, G; Volkert, C

INTERNATIONAL JOURNAL OF FRACTURE, 2008, Band 153, Heft 1, S. 85-92

Schmitt, LA; Theissmann, R; Kling, J; Kungl, H; Hoffmann, MJ; Oberacker, R

 

PHASE TRANSITIONS, 2008, Band 81, Heft 4, S. 323-330

Schmitt, LA; Theissmann, R; Kling, J; Kungl, H; Hoffmann, MJ; Fuess, H

PHASE TRANSITIONS, 2008, Band 81, Heft 4, S. 323-330

Guellali, M; Oberacker, R; Hoffmann, MJ

COMPOSITES SCIENCE AND TECHNOLOGY, 2008, Band 68, Heft 5, S. 1115-1121

Guellali, M; Oberacker, R; Hoffmann, MJ

COMPOSITES SCIENCE AND TECHNOLOGY, 2008, Band 68, Heft 5, S. 1122-1130

Kungl, H; Hoffmann, MJ

SENSORS AND ACTUATORS A - PHYSICAL SENSORS, 2008, Band 144, Heft 2, S. 328-336

Fett, T; Rizzi, G; Hoffmann, MJ; Oberacker, R; Wagner, S

JOURNAL OF MATERIALS SCIENCE, 2008, Band 43, Heft 6, S. 2077-2081

Zagonel, LF; Barrett, F; Renault, O; Bailly, A; Bäurer, M; Hoffmann, MJ;Shih, SJ; Cockayne, D

SURFACE AND INTERFACE ANALYSIS, 2008, Band 40, Heft 13, S. 1709-1712

Fett, T; Fünfschilling, S; Hoffmann, MJ; Oberacker, R; Jelitto, H; Schneider, GA

JOURNAL OF THE AMERICAN SOCIETY, Band 91, Heft 11, S. 3638-3642

Fett, T; Fünfschilling, S; Hoffmann, MJ; Oberacker, R; Jelitto, H; Schneider, GA

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2008, Band 91, Heft 11, S. 3638-3642

Fett, T; Rizzi, G; Esfehanian, M; Oberacker, R

JOURNAL OF TESTING AND EVALUATION, 2008, Band 36, Heft 3

Fett, T; Rizzi, G; Esfehanian, M; Oberacker, R

JOURNAL OF TESTING AND EVALUATION, 2008, Band 36, Heft 3, S. 285-290

Shih, S-J; Dudeck, K; Choi, S-Y; Bäurer, M; Hoffmann, MJ; Cockayne, D

JOURNAL OF PHYSICS, 2008, Conference Series 94

Shih, SJ; Dudeck, K; Choi, SY; Bäurer, M; Hoffmann, MJ; Cockayne, D

JOURNALS OF PHYSICS: CONFERENCE SERIES 94, 2008

Farooq, MU; Villaurrutia, R; MacLaren, I; Kungl, H; Hoffmann, MJ; Freudenberger, JJ; Bouzy, E

EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007; JOURNAL OF PHYSICS CONFERENCE SERIES, Band 126, S. 12012-12012

Riva, M; Hoffmann, MJ; Oberacker, R; Fett, T

JOURNAL OF MATERIALS SCIENCE, 2008, Heft 43, S. 402-405

Kruzic, JJ; Satet, RL; Hoffmann, MJ; Cannon, RM; Ritchie, RO

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2008, Band 91, Heft 6, S. 1986-1994

Farooq, MU; Villaurrutia, R; MacLaren, I; Kungl, H; Hoffmann, MJ; Fundenberger, J-J; Bouzy, E

JOURNAL OF MICROSCOPY, 2008, Band 230, Heft 3, S. 445-454