The following methods will be introduced within this lecture:

• microscopic methods: optical microscopy, electron microscopy (SEM/TEM), atomic force microscopy
• material and microstructure analyses by means of X-ray, neutron and electron beams
• analysis methods at SEM/TEM (e.g. EELS)
• spectroscopic methods (e.g. EDS / WDS)

learning objectives:
The students have fundamental knowledge about methods of material analysis. They have a basic understanding to transfer this fundamental knowledge on problems in engineering science. Furthermore, the students have the ability to describe technical material by its microscopic and submicroscopic structure.

Vorlesungsskript (wird zu Beginn der Veranstaltung ausgegeben).

Literatur wird zu Beginn der Veranstaltung bekanntgegeben.